Yield management in TFT-LCD manufacturing by using regression and neural network techniques
Kun-Lin Hsieh
Year of publication: |
2010
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Authors: | Hsieh, Kun-lin |
Published in: |
International journal of manufacturing technology and management. - Milton Keynes [u.a.] : Inderscience Enterprises, ISSN 1368-2148, ZDB-ID 20374021. - Vol. 20.2010, 1/2/3/4, p. 300-315
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