Yield management in TFT-LCD manufacturing by using regression and neural network techniques
Kun-Lin Hsieh
| Year of publication: |
2010
|
|---|---|
| Authors: | Hsieh, Kun-lin |
| Published in: |
International journal of manufacturing technology and management. - Milton Keynes [u.a.] : Inderscience Enterprises, ISSN 1368-2148, ZDB-ID 20374021. - Vol. 20.2010, 1/2/3/4, p. 300-315
|
| Extent: | graph. Darst. |
|---|---|
| Type of publication: | Article |
| Language: | English |
| Source: |
Persistent link: https://www.econbiz.de/10009873208