Yield to commission : is an OTC market model to blame for growing systemic risk?
Christopher Whalen
| Year of publication: |
2008
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| Authors: | Whalen, Christopher |
| Published in: |
The journal of structured finance. - New York, NY : Institutional Investor, Inc., ISSN 1082-3220, ZDB-ID 22338986. - Vol. 14.2008, 2, p. 8-15
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| Type of publication: | Article |
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| Language: | English |
| Source: |
Persistent link: https://www.econbiz.de/10009881928