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~isPartOf:"International journal of production research"
~subject:"Cost analysis"
~subject:"Statistical quality control"
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International journal of production research
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Wafer fabrication yield learning and cost analysis based on in-line inspection
Tirkel, Israel
;
Rabinowitz, Gad
;
Price, David
; …
- In:
International journal of production research
54
(
2016
)
11/12
,
pp. 3578-3590
Persistent link: https://www.econbiz.de/10011497571
Saved in:
2
A quick switching sampling system by variables for controlling lot fraction nonconforming
Liu, Shih-Wen
;
Wu, Chien-wei
- In:
International journal of production research
54
(
2016
)
5/6
,
pp. 1839-1849
Persistent link: https://www.econbiz.de/10011498246
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