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~isPartOf:"Premier reference source"
~isPartOf:"Research policy : policy, management and economic studies of science, technology and innovation"
~person:"Benner, Mary"
~subject:"Theory"
~subject:"United States"
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Close to you? : bias and precision in patent-based measures of technological proximity
Benner, Mary
;
Waldfogel, Joel
- In:
Research policy : policy, management and economic …
37
(
2008
)
9
,
pp. 1556-1567
Persistent link: https://www.econbiz.de/10003795374
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