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~isPartOf:"International journal of production research"
~person:"Wu, Lihui"
~subject:"Complexity management"
~subject:"Semiconductor"
~type_genre:"Article in journal"
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Fuzzy neural network based yield prediction model for semiconductor manufacturing system
Wu, Lihui
;
Zhang, Jie
- In:
International journal of production research
48
(
2010
)
10/12
,
pp. 3225-3243
Persistent link: https://www.econbiz.de/10003975748
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