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Reliability in a Time-Driven Product Development Process
Yuan, Lu; Loh, H.T.; Ibrahim, Y.; Sander, P.C.; … - In: Quality and reliability engineering international 15 (1999) 6, pp. 427-430
Persistent link: https://www.econbiz.de/10006387508
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Quality and Reliability Problems from a Consumer's Perspective: an Increasing Problem Overlooked by Businesses?
den Ouden, Elke; Yuan, Lu; Sonnemans, Peter J.M.; … - In: Quality and reliability engineering international 22 (2006) 7, pp. 821-838
Persistent link: https://www.econbiz.de/10007301791
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Towards a more systematic analysis of uncertain user-product interactions in product development: an enhanced user-product interaction framework
Lu, Yuan; den Ouden, Elke; Brombacher, Aarnout; Geudens, Wim - In: Quality and reliability engineering international 23 (2007) 1, pp. 19-30
Persistent link: https://www.econbiz.de/10007597242
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Fourth International Conference on Quality and Reliability (ICQR2005)
Lu, Yuan; Xie, Min - In: Quality and reliability engineering international 23 (2007) 1, pp. 1-2
Persistent link: https://www.econbiz.de/10007597244
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Improving Product Quality and Reliability with Customer Experience Data
Brombacher, Aarnout; Hopma, Eva; Ittoo, Ashwin; Lu, Yuan; … - In: Quality and reliability engineering international 28 (2012) 8, pp. 873-886
Persistent link: https://www.econbiz.de/10010046800
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Reliability analysis of electronic devices with multiple competing failure modes involving performance aging degradation
Huang, Wei; Askin, Ronald G. - In: Quality and reliability engineering international 19 (2003) 3, pp. 241
Persistent link: https://www.econbiz.de/10006370209