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LOCALIZED MODEL SELECTION FOR REGRESSION
Yang, Yuhong; Allen, D.M.; Birgé, L.; Burman, P.; … - In: Econometric theory 24 (2008) 2, pp. 472-492
Persistent link: https://www.econbiz.de/10007912723
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F INFORMATION COMMERCE & TECHNOLOGY - Software engineering technology watch
Cowan, R.D.; McKendall Jr, Alan; Mili, Ali; Yang, L.; … - In: Operations research, Management science : OR MS ; the … 42 (2002) 6, pp. 695-698
Persistent link: https://www.econbiz.de/10006507878
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Locating and staffing service centers under service level constraints
Yang, L.; Ng, C.T.; Cheng, T.C.E. - In: European journal of operational research : EJOR 201 (2010) 1, pp. 55-71
Persistent link: https://www.econbiz.de/10008349387
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The value of public information in commodity futures markets
Garcia, P.; Irwin, S.H.; Leuthold, R.M.; Yang, L. - In: Journal of economic behavior & organization : JEBO 32 (1997) 4, pp. 559-570
Persistent link: https://www.econbiz.de/10007367141
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Optimal production strategy under demand fluctuations: Technology versus capacity
Yang, L.; Ng, C.T.; Cheng, T.C.E. - In: European journal of operational research : EJOR 214 (2011) 2, pp. 393-403
Persistent link: https://www.econbiz.de/10009166449
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The Availability of Inspected Systems Subject to Shocks and Graceful Degradation
Klutke, G.-A.; Yang, Y. - In: IEEE transactions on reliability : R ; IEEE T R 51 (2002) 3, pp. 371-374
Persistent link: https://www.econbiz.de/10006615951
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PAPERS - A Distribution-Free Lower Bound for Availability of Quantile-Based Inspection Schemes
Yang, Y.; Klutke, G.-A. - In: IEEE transactions on reliability : R ; IEEE T R 50 (2001) 4, pp. 419-421
Persistent link: https://www.econbiz.de/10006618192
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NETWORK-SYSTEM COMPUTATION AND ANALYSIS - Lifetime-Characteristics and Inspection-Schemes for Lévy Degradation Processes
Yang, Y.; Klutke, G.-A. - In: IEEE transactions on reliability : R ; IEEE T R 49 (2000) 4, pp. 377-382
Persistent link: https://www.econbiz.de/10006621833
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Bayes estimation for the Pareto failure-model using Gibbs sampling
Tiwari, R.; Yang, Y.; Zalkikar, J. - In: IEEE transactions on reliability : R ; IEEE T R 45 (1996) 3, pp. 471-475
Persistent link: https://www.econbiz.de/10006633054
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Tax competition under the threat of capital flight
Yang, Y. - In: Economics letters 53 (1996) 3, pp. 323-330
Persistent link: https://www.econbiz.de/10006794998