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Simulation Models for Robust D...
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Berichte der Mathematisch-Statistischen Sektion in der Forschungsgesellschaft Joanneum
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Sampling from Poisson, binomial and hypergeometric distributions : ratio of uniforms as a simple and fast alternative
Stadlober, Ernst
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1989
Persistent link: https://www.econbiz.de/10004063233
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Statistical Modelling of MOS Transistor Mismatch for High-voltage CMOS Processes
Posch, Werner
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Enichlmair, Hubert
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Schirgi, Eduard
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- In:
Quality and reliability engineering international
21
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2005
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5
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pp. 477-490
Persistent link: https://www.econbiz.de/10006362016
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