Determining the lifetime of CD-RWs using efficient sampling on a production line
Year of publication: |
2003
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Authors: | Chen, Chie-Bein |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 19.2003, 3, p. 215-226
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