A methodology of pattern recognition schemes for two variables in SPC
| Year of publication: |
1995
|
|---|---|
| Authors: | Chih, Wen-Hai ; Rollier, Dwayne A. |
| Published in: |
International journal of quality & reliability management. - Bradford : Emerald, ISSN 0265-671X, ZDB-ID 517872. - Vol. 12.1995, 3, p. 86
|