A Tool for Evaluating Time-Varying-Stress Accelerated Life Test Plans With Log-Location-Scale Distributions
| Year of publication: |
2010
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|---|---|
| Authors: | Hong, Y ; Ma, H ; Meeker, W Q |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 59.2010, 4, p. 620-628
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