An integrated approach for process monitoring using wavelet analysis and competitive neural network
Year of publication: |
2007
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Authors: | Wang, Chih-Hsuan ; Kuo, Way ; Qi, Hairong |
Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 45.2007, 1, p. 227
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