Automatic bubble defect inspection for microwave communication substrates using multi-threshold technique based co-occurrence matrix
Year of publication: |
2010
|
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Authors: | Jiang, Bernard C. ; Wang, Chien-chih ; Chen, Hsin-ju ; Chu, Chien-cheng |
Published in: |
International journal of production research. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 160477-6. - Vol. 48.2010, 7/8 (1/15.4.), p. 2361-2371
|
Subject: | Produktionssteuerung | Production control | Qualitätsmanagement | Quality management | Telekommunikationsausrüster | Telecommunications equipment industry |
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