Better defect detection and prevention through improved inspection and testing approach in small and medium scale software industry
V. Suma; T. R. Gopalakrishnan Nair
| Year of publication: |
2010
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|---|---|
| Authors: | Suma, V. ; Nair, T. R. Gopalakrishnan |
| Published in: |
International journal of productivity and quality management : IJPQM. - [Olney, Bucks] : Inderscience Enterprises, ISSN 1746-6474, ZDB-ID 21933765. - Vol. 6.2010, 1, p. 71-90
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| Extent: | graph. Darst. |
|---|---|
| Type of publication: | Article |
| Language: | English |
| Source: |
Persistent link: https://www.econbiz.de/10009869999