Burn-in and Accelerated Testing - Some Considerations on System Burn-in
| Year of publication: |
2005
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|---|---|
| Authors: | Kim, K.O. ; Kuo, W. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 54.2005, 2, p. 207-214
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