Circuits - Relating Integrated Circuit Yield and Time-Dependent Reliability for Various Defect Density Distributions
| Year of publication: |
2006
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| Authors: | Kim, K.O. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 55.2006, 2, p. 307-313
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