Comparison and evaluation of lot-to-order matching policies for a semiconductor assembly and test facility
| Year of publication: |
2000
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|---|---|
| Authors: | Fowler, John ; Knutson, Kraig ; Carlyle, Matt |
| Published in: |
International journal of production research : American Institute of Industrial Engineers ; Society of Manufacturing Engineers. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 1604776. - Vol. 38.2000, 8, p. 1841-1854
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