Computational resiliency
Year of publication: |
2002
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Authors: | Lee, J. ; Chapin, S.J. ; Taylor, S. |
Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 18.2002, 3, p. 185-200
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