Cycle time estimation for semiconductor final testing processes with Weibull-distributed weiting time
Y. T. Tai, W. L. Pearn and J. H. Lee
| Year of publication: |
2012
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|---|---|
| Authors: | Tai, Y. T. ; Pearn, Wen-lea ; Lee, J. H. |
| Published in: |
International journal of production research. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 160477-6. - Vol. 50.2012, 2 (15.1.), p. 581-592
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| Subject: | cycle time estimation | semiconductor final testing | Weibull distribution | Schätztheorie | Estimation theory | Halbleiter | Semiconductor | Halbleiterindustrie | Semiconductor industry | Zeitreihenanalyse | Time series analysis | Zeit | Time | Statistische Verteilung | Statistical distribution |
| Extent: | graph. Darst. |
|---|---|
| Type of publication: | Article |
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10009549619