Estimating Long and Short Run Effects in Static Panel Models
Year of publication: |
2005
|
---|---|
Authors: | Egger, Peter ; Pfaffermayr, Michael |
Published in: |
Econometric Reviews. - Taylor & Francis Journals, ISSN 0747-4938. - Vol. 23.2005, 3, p. 199-214
|
Publisher: |
Taylor & Francis Journals |
Subject: | Short run effects | Long run effects | Small sample bias | Panel econometrics |
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