Evaluation on a Two-day Time Scale of High-reliability Electronic Assemblies by In-situ Electrical and Opto-mechanical Test Techniques
| Year of publication: |
1996
|
|---|---|
| Authors: | Gregoris, G. ; Bouton, F. ; Keukeleire, C.De ; Siliprandi, P. ; Baio, F. ; Schepper, L.De ; Ceuninck, W.De ; Tielemans, L. ; Ahrens, T. ; Krumm, M. |
| Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 12.1996, 4, p. 247-252
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