The Use of Early Resistance and Early TCR Changes to Predict the Reliability of On-chip Interconnects
| Year of publication: |
1994
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|---|---|
| Authors: | D'Haeger, V. ; Stulens, H. ; Ceuninck, W.De ; Schepper, L.De ; Tielemans, L. ; Gallopyn, G. ; Pauw, P.De ; Stals, L.M. |
| Published in: |
Quality and reliability engineering international. - Chichester [u.a.] : Wiley, ISSN 0748-8017, ZDB-ID 506412. - Vol. 10.1994, 4, p. 309-314
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