Excess thermal-noise in the electrical breakdown of random resistor networks
| Year of publication: |
1999
|
|---|---|
| Authors: | Pennetta, C. ; Kiss, L.B. ; Gingl, Z. ; Reggiani, L. |
| Published in: |
The European Physical Journal B - Condensed Matter and Complex Systems. - Springer. - Vol. 12.1999, 1, p. 61-65
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| Publisher: |
Springer |
| Subject: | PACS. 72.70.+m Noise processes and phenomena[:AND:]73.61.-r Electrical properties of specific thin films and layer structures | (multilayers | superlattices | quantum wells | wires | and dots) - 81.70.Cv Nondestructive testing: ultrasonic testing | photoacoustic testing |
| Extent: | text/html |
|---|---|
| Type of publication: | Article |
| Source: |
Persistent link: https://www.econbiz.de/10009325158