Expectation Maximization Algorithm for One Shot Device Accelerated Life Testing with Weibull Lifetimes, and Variable Parameters over Stress
| Year of publication: |
2013
|
|---|---|
| Authors: | Balakrishnan, N ; Ling, M H |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 62.2013, 2, p. 537-536
|