Multiple-Stress Model for One-Shot Device Testing Data Under Exponential Distribution
| Year of publication: |
2012
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|---|---|
| Authors: | Balakrishnan, N ; Ling, M H |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 61.2012, 3, p. 809-822
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