How to Count Patents and Value Intellectual Property : Uses of Patent Renewal and Application Data
| Year of publication: |
[2021]
|
|---|---|
| Authors: | Lanjouw, Jean Olson ; Pakes, Ariel ; Putnam, Jonathan D. |
| Publisher: |
[S.l.] : SSRN |
| Subject: | Patent | Immaterialgüterrechte | Intellectual property rights | Innovation | Welt | World | Messung | Measurement |
| Extent: | 1 Online-Ressource (33 p) |
|---|---|
| Series: | NBER Working Paper ; No. w5741 |
| Type of publication: | Book / Working Paper |
| Language: | English |
| Notes: | Nach Informationen von SSRN wurde die ursprüngliche Fassung des Dokuments September 1996 erstellt |
| Source: | ECONIS - Online Catalogue of the ZBW |
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How to Count Patents and Value Intellectual Property : Uses of Patent Renewal and Application Data
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