Model-based clustering for integrated circuit yield enhancement
| Year of publication: |
2007
|
|---|---|
| Authors: | Hwang, Jung Yoon ; Kuo, Way |
| Published in: |
European journal of operational research : EJOR. - Amsterdam : Elsevier, ISSN 0377-2217, ZDB-ID 2430034. - Vol. 178.2007, 1, p. 143-153
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