Patent quality : Towards a systematic framework for analysis and measurement
Kyle Higham, Gaétan de Rassenfosse, Adam B. Jaffe
| Year of publication: |
2021
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|---|---|
| Authors: | Higham, Kyle ; De Rassenfosse, Gaétan ; Jaffe, Adam B. |
| Published in: |
Research policy : policy, management and economic studies of science, technology and innovation. - Amsterdam [u.a.] : Elsevier, ISSN 0048-7333, ZDB-ID 121149-3. - Vol. 50.2021, 4, p. 1-26
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| Subject: | patents | patent quality | patent value | patent citations | patent policy | technological impact | Patent | Patentrecht | Patent law | Innovation | Messung | Measurement | Bibliometrie | Bibliometrics |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1016/j.respol.2021.104215 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10012695374