Patent Quality : Towards a Systematic Framework for Analysis and Measurement
Year of publication: |
2022
|
---|---|
Authors: | Higham, Kyle ; De Rassenfosse, Gaétan ; Jaffe, Adam B. |
Publisher: |
[S.l.] : SSRN |
Subject: | Patent | Messung | Measurement | Innovation |
Extent: | 1 Online-Ressource (50 p) |
---|---|
Series: | NBER Working Paper ; No. w27598 |
Type of publication: | Book / Working Paper |
Language: | English |
Notes: | Nach Informationen von SSRN wurde die ursprüngliche Fassung des Dokuments September 2020 erstellt |
Source: | ECONIS - Online Catalogue of the ZBW |
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