Reliability assessment for one‐shot product with Weibull lifetime components
Year of publication: |
2010
|
---|---|
Authors: | Pan, Chung‐Chu ; Chu, Liou |
Published in: |
International Journal of Quality & Reliability Management. - Emerald Group Publishing Limited, ISSN 1758-6682, ZDB-ID 1466792-7. - Vol. 27.2010, 5, p. 596-610
|
Publisher: |
Emerald Group Publishing Limited |
Subject: | Product reliability | Monte Carlo simulation | Quality assessment |
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