Sparse group principal component analysis using elastic-net regularisation and its application to virtual metrology in semiconductor manufacturing
Year of publication: |
2025
|
---|---|
Authors: | Lee, Geonseok ; Wang, Tianhui ; Kim, Dohyun ; Jeong, Myong Kee |
Subject: | Principal component analysis(PCA) | sparse learning | feature extraction | sensor reduction | alternating direction method ofmultipliers (ADMM) |
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