Stochastic technology life cycle analysis using multiple patent indicators
Changyong Lee, Juram Kim, Ohjin Kwon, Han-Gyun Woo
| Year of publication: |
May 2016
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|---|---|
| Authors: | Lee, Changyong ; Kim, Juram ; Kwon, Ohjin ; Woo, Han-Gyun |
| Published in: |
Technological forecasting & social change : an international journal. - Amsterdam : Elsevier, ISSN 0040-1625, ZDB-ID 280700-2. - Vol. 106.2016, p. 53-64
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| Subject: | Stochastic technology life cycle analysis | Technology's progression | Hidden Markov model | Multiple patent indicators | Technology intelligence | Patent | Theorie | Theory | Technischer Fortschritt | Technological change | Produktlebenszyklus | Product life cycle | Markov-Kette | Markov chain | Wirtschaftsindikator | Economic indicator | Stochastischer Prozess | Stochastic process | Technologie | Technology | Lebenszyklus | Life cycle |
| Type of publication: | Article |
|---|---|
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal |
| Language: | English |
| Other identifiers: | 10.1016/j.techfore.2016.01.024 [DOI] |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://ebvufind01.dmz1.zbw.eu/10011609990