SYSTEM RELIABILITY -- MEASURES, PREDICTION, OPTIMIZATION, ESTIMATION - A comparison of electronic-reliability prediction models
| Year of publication: |
1999
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| Authors: | Jones, J. ; Hayes, J. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 48.1999, 2, p. 127-134
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