SYSTEM RELIABILITY -- MEASURES, PREDICTION, OPTIMIZATION, ESTIMATION - Investigation of the Occurrence of: No-Faults-Found in Electronic Equipment
| Year of publication: |
2001
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| Authors: | Jones, J. ; Hayes, J. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 50.2001, 3, p. 289-292
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