The geography of R&D : tobit analysis and Bayesian approach to mapping R&D activities for the Netherlands
Year of publication: |
2000
|
---|---|
Authors: | Ouwersloot, Hans ; Rietveld, Piet |
Publisher: |
Rotterdam [u.a.] : Tinbergen Inst. |
Subject: | R&D | innovation | space | Bayesian approach | Niederlande | Netherlands | Bayes-Statistik | Bayesian inference | Innovation | Theorie | Theory |
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