TUTORIAL & REVIEW - Pitfalls of accelerated testing
| Year of publication: |
1998
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|---|---|
| Authors: | Meeker Jr, W. ; Escobar, L. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 47.1998, 2, p. 114-118
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