Non-parametric Bayesian modeling of hazard rate with a change point for nanoelectronic devices
| Year of publication: |
2012
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| Authors: | Yang, Chia-Han ; Yuan, Tao ; Kuo, Way ; Kuo, Yue |
| Published in: |
IIE transactions / Institute of Industrial Engineers, Norcross, Ga : industrial engineering and development. - Philadelphia, Pa : Taylor & Francis, ISSN 0569-5554, ZDB-ID 2460191. - Vol. 44.2012, 7 (1.7.), p. 496-507
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