True sparse PCA for reducing the number of essential sensors in virtual metrology
Year of publication: |
2024
|
---|---|
Authors: | Xie, Yifan ; Wang, Tianhui ; Jeong, Young-Seon ; Tosyali, Ali ; Jeong, Myong Kee |
Subject: | feature extraction | principal component | sensors reduction | sparsity | Virtual metrology |
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