ACCELERATED TESTING & SCREENING - Inferences on a simple step-stress model with type-II censored exponential data
| Year of publication: |
1998
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| Authors: | Xiong, C. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 47.1998, 2, p. 142-146
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