Testing - Analysis of a Simple Step-Stress Life Test With a Random Stress-Change Time
| Year of publication: |
2006
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|---|---|
| Authors: | Xiong, C. ; Zhu, K. ; Ji, M. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 55.2006, 1, p. 67-74
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