Lifetime Data - Analysis of Grouped and Censored Data From Step-Stress Life Test
| Year of publication: |
2004
|
|---|---|
| Authors: | Xiong, C. ; Ji, M. |
| Published in: |
IEEE transactions on reliability : R ; IEEE T R. - New York, NY, ISSN 0018-9529, ZDB-ID 2416372. - Vol. 53.2004, 1, p. 22-28
|