Optimisation of the process control in a semiconductor company : model and case study of defectivity sampling
M. Shanoun, S. Bassetto, S. Bastoini and P. Vialletelle
| Year of publication: |
2011
|
|---|---|
| Authors: | Shanoun, M. ; Bassetto, Samuel Jean ; Bastoini, S. ; Vialletelle, P. |
| Published in: |
International journal of production research. - London : Taylor & Francis, ISSN 0020-7543, ZDB-ID 160477-6. - Vol. 49.2011, 12/13 (15/1.6/7.), p. 3873-3890
|
| Subject: | Halbleiterindustrie | Semiconductor industry | Statistische Qualitätskontrolle | Statistical quality control | Algorithmus | Algorithm | Frankreich | France |
| Extent: | Ill., graph. Darst. |
|---|---|
| Type of publication: | Article |
| Type of publication (narrower categories): | Aufsatz in Zeitschrift ; Article in journal ; Fallstudie ; Case study |
| Language: | English |
| Source: | ECONIS - Online Catalogue of the ZBW |
Persistent link: https://www.econbiz.de/10009153010