Patent Quality : Towards a Systematic Framework for Analysis and Measurement
Year of publication: |
2020
|
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Authors: | Higham, Kyle |
Other Persons: | De Rassenfosse, Gaétan (contributor) ; Jaffe, Adam B. (contributor) |
Publisher: |
[2020]: [S.l.] : SSRN |
Subject: | Patent | Messung | Measurement | Innovation |
Extent: | 1 Online-Ressource (49 p) |
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Type of publication: | Book / Working Paper |
Language: | English |
Notes: | Nach Informationen von SSRN wurde die ursprüngliche Fassung des Dokuments September 22, 2020 erstellt |
Other identifiers: | 10.2139/ssrn.3697223 [DOI] |
Classification: | O30 - Technological Change; Research and Development. General ; O34 - Intellectual Property Rights: National and International Issues |
Source: | ECONIS - Online Catalogue of the ZBW |
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