Patent Quality : Towards a Systematic Framework for Analysis and Measurement
Year of publication: |
2020
|
---|---|
Authors: | Higham, Kyle |
Other Persons: | De Rassenfosse, Gaétan (contributor) ; Jaffe, Adam B. (contributor) |
Publisher: |
[2020]: [S.l.] : SSRN |
Subject: | Patent | Messung | Measurement | Innovation |
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